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  1. CLF

    BULGARIAN ACADEMY OF SCIENCES CENTRAL LABORATORY OF PHOTOPROCESSES "Acad. J. Malinowski" Director: Assoc. Prof. Nikolay Starbov, PhD Tel. : +359(2)872 00 73 ...
    sensors2
    optical coatings1
    oxides1
    thin films1
    microlithography1
    optical properties1
    nanolithography1
    organic semiconductors1
    laser modification1
    photo-1
    chalcogenides0
    deposition techniques0
    electron-0
    ion- induced effects0
    nanocomposite materials0
    oxygen catalysts0
    silver halides0

    www.clf.bas.bg - 2009-02-06

  2. Deconvolution and Entropy Consulting (DEC)

    Spectroscopy software: Electronic Structure Tools, deconvolution and maximum entropy application programs for GRAMS/32.
    multiple2
    SSD1
    GRAMS1
    scattering1
    deconvolution1
    optical properties1
    maximum entropy1
    van der Waals1
    spectroscopy software1
    DeNoyer1
    Razor Tools1
    electron energy loss0
    electronic structure analysis0
    Hamaker constants0
    Kramers-Kronig0
    London dispersion0
    Razor Library0
    Roger H. French0
    Spectrum Square Associates0
    SR-VEEL0
    sum rule0
    VEELS0

    www.deconvolution.com - 2009-02-04

  3. Thin Film Home Page - HORIBA

    Thin Film metrology, ellipsometry and process control
    instrumentation2
    real time2
    process control2
    metrology2
    rotating1
    thin film1
    in-situ1
    sofie1
    interferometry1
    thin films1
    insitu1
    compensator1
    ellipsometer1
    ellipsometry1
    optical properties1
    ellipsometers1
    birefringence1
    spectroscopic ellipsometry1
    optical constants1
    index of refraction1
    spectroscopic ellipsometer1
    thin film thickness1
    optical emission spectroscopy1
    multiwavelength ellipsometer1
    real-time process monitoring1
    thin film metrology1
    focused beam ellipsometry1
    infrared ellipsometer1
    infrared ellipsometry1
    retardance1
    phase modulated ellipsometer1

    www.ellipsometer.info - 2009-04-04

  4. Thin Film Home Page

    Thin Film metrology, ellipsometry and process control
    instrumentation2
    real time2
    process control2
    metrology2
    rotating1
    thin film1
    in-situ1
    sofie1
    interferometry1
    thin films1
    insitu1
    compensator1
    ellipsometer1
    ellipsometry1
    optical properties1
    ellipsometers1
    birefringence1
    spectroscopic ellipsometry1
    optical constants1
    index of refraction1
    spectroscopic ellipsometer1
    thin film thickness1
    optical emission spectroscopy1
    multiwavelength ellipsometer1
    real-time process monitoring1
    thin film metrology1
    focused beam ellipsometry1
    infrared ellipsometer1
    infrared ellipsometry1
    retardance1
    phase modulated ellipsometer1

    www.ellipsometry.co.uk - 2009-02-08

  5. Process Control Products from HORIBA Jobin Yvon

    Process Applications of Thin Film
    instrumentation2
    real time2
    process control2
    metrology2
    rotating1
    thin film1
    in-situ1
    sofie1
    interferometry1
    thin films1
    insitu1
    compensator1
    ellipsometer1
    ellipsometry1
    optical properties1
    ellipsometers1
    birefringence1
    spectroscopic ellipsometry1
    optical constants1
    index of refraction1
    spectroscopic ellipsometer1
    thin film thickness1
    optical emission spectroscopy1
    multiwavelength ellipsometer1
    real-time process monitoring1
    thin film metrology1
    focused beam ellipsometry1
    infrared ellipsometer1
    infrared ellipsometry1
    retardance1
    phase modulated ellipsometer1

    www.jyprocesscontrol.com - 2009-02-07

  6. High End Research Ellipsometer

    UVISEL Ellipsometers
    Delta2
    instrumentation2
    Psi2
    real time2
    metrology2
    rotating1
    insitu1
    compensator1
    ellipsometer1
    ellipsometry1
    optical properties1
    ellipsometers1
    birefringence1
    spectroscopic ellipsometry1
    ex-situ1
    optical constants1
    index of refraction1
    spectroscopic ellipsometer1
    thin film thickness1
    multiwavelength ellipsometer1
    focused beam ellipsometry1
    infrared ellipsometer1
    infrared ellipsometry1
    retardance1
    polarised light1
    phase modulation1
    characterisation of thin film0
    ellipsometric angles0
    fresnel reflection0
    in-situ uvisel ellipsometer0
    real time process monitoring0
    uvisel0

    www.uvisel.com - 2009-02-14

  7. James D. Livingston - Home

    The website maintained by James D. Livingston.
    magnets2
    Civil War2
    Fredericksburg2
    slavery2
    feminist1
    Gettysburg1
    magnetism1
    materials science1
    Underground Railroad1
    abolition1
    Seneca Falls1
    electromagnetism1
    suffrage1
    electromagnets1
    superconductors1
    Harriet Tubman1
    optical properties1
    Susan B. Anthony1
    women’s rights1
    Elizabeth Cady Stanton1
    magnetic force1
    magnetic properties1
    electrical properties1
    Lucretia Mott1
    author James D. Livingston0
    Gallant Pelham0
    Martha Coffin Wright0
    Sherry H. Penney0

    www.averydangerouswoman.net - 2009-02-13

  8. Scientific Computing International - Raising Thin Film Metrology to a New Level. SCI offers metrology systems for thin-film material characterization, with ...

    Scientific Computing International (SCI) provides high resolution thin film metrology tools and analysis software products to leading companies in the ...
    index3
    SCI2
    metrology2
    thin film1
    thickness1
    film thickness1
    reflectometer1
    ellipsometer1
    roughness1
    spectrophotometry1
    ellipsometry1
    material analysis1
    optical properties1
    ellipsometers1
    spectroscopic ellipsometry1
    material characterization1
    reflectometry1
    index of refraction1
    spectroscopic ellipsometer1
    thin film thickness1
    film thickness measurement1
    multiwavelength ellipsometer1
    thin film metrology1
    reflectometers1
    extinction coefficient1
    crystallinity1
    metrology tools1
    multi angle reflectometer1
    spectroscopic reflectometer1
    spectroscopic reflectometry1
    thin film metrology tools0

    www.sci-soft.com - 2009-02-07

  9. Scientific Computing International - FilmTek Instruments

    FilmTek™ 2000SE - Spectroscopic Ellipsometer. Based on a rotating compensator design, the FilmTek™ 2000SE combines spectroscopic ellipsometry with normal inc ...
    index3
    SCI2
    metrology2
    thin film1
    thickness1
    spectrophotometer1
    film thickness1
    reflectometer1
    ellipsometer1
    roughness1
    spectrophotometry1
    ellipsometry1
    material analysis1
    optical properties1
    ellipsometers1
    spectroscopic ellipsometry1
    material characterization1
    reflectometry1
    index of refraction1
    spectroscopic ellipsometer1
    thin film thickness1
    film thickness measurement1
    multiwavelength ellipsometer1
    thin film metrology1
    reflectometers1
    extinction coefficient1
    crystallinity1
    metrology tools1
    multi angle reflectometer1
    spectroscopic reflectometer1
    spectroscopic reflectometry1

    www.sciinstruments.com - 2009-02-07

  10. PlasmaScope from HORIBA Jobin Yvon

    PlasmaScope, portable multichannel optical emission spectrometer with advanced end point
    portable3
    instrumentation2
    real time2
    process control2
    metrology2
    rotating1
    oes1
    multichannel1
    endpoint1
    insitu1
    compensator1
    ellipsometer1
    ellipsometry1
    optical properties1
    ellipsometers1
    birefringence1
    spectroscopic ellipsometry1
    optical constants1
    index of refraction1
    spectroscopic ellipsometer1
    thin film thickness1
    multiwavelength ellipsometer1
    focused beam ellipsometry1
    infrared ellipsometer1
    infrared ellipsometry1
    retardance1
    end point detection1
    optical emission spectrometer0
    plasma chemical composition0
    plasma diagnosis0
    plasmascope0
    reactive species0

    www.plasmascope.com - 2009-02-06

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